Angle-Resolved Photoelectron Spectroscopy (ARPES) is an experimental approach capable of directly resolving a material’s band structure. This powerful technique has been used to unravel correlated states, phase transitions, and excited states in myriads of materials. However, until recently, conducting ARPES measurements on functioning electrical devices was technically prohibitive.

To overcome these challenges, we collaborate with colleagues at BESSY II and RWTH Aachen University to implement a new ARPES setup capable of device-level measurements. Our role is to build device architectures capable of manipulating carrier density, electrical fields, or mechanical strain in 2D material devices compatible with ARPES measurements.