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DESCRIPTION: Osaka University   High resolution spin- and angle-resolved ph
 otoelectron spectroscopy (SP-ARPES) in micro-nano regions is very widely de
 manded in order to clarify surface and bulk electronic structures of solids
  by tuning the excitation photon energies (hν). Spatial resolution is also 
 beneficial for development of spintronics devices. However\, extremely low 
 spin detection efficiency has hindered its progress over decades until very
  recently.   The development of a momentum microscope (M.M.) composed of a 
 PEEM type input lens and an aberration corrected tandem S-type double hemis
 pherical deflection analyzers (DHDAs) has opened a breakthrough. 2 dimentio
 nal (2D) momentum dependent E B (k x \,k y ) can be measured in a very wide
    k   space with high energy and momentum resolutions better than 12 meV a
 nd 0.005 Å -1 . Nearly 10\,000 (k x \,k y ) points can be simultaneously me
 asured over a full surface/ bulk Brillouin zone (BZ) at the same time for a
  certain E K (or E B ).   2D imaging spin filter such as Au/Ir(001) can be 
 installed behind this M.M. Then spin asymmetric 2D E B (k x \,k y ) images 
 can be recorded at two electron incidence energies (10.25 &amp\; 11.5 eV) w
 ith opposite sign of spin sensitivity. From these two spectra\, spin resolv
 ed spectrum in the wide   k   space is easily derived in the form of P s (E
  B (k x \,k y )). P s (E B (k x \,k y \,k z ) detection is very easy by cha
 nging hν. Since the PEEM can collect whole 2π steradian emitted photoelectr
 ons\, 2D multi-channel figure of merit of this spin detection is more than 
 ∼million times or sometimes sub-billion times higher than the Mott detector
  and spin-LEED detector and even ∼10\,000 times higher than the most advanc
 ed Fe-O VLEED spin detector.   Examples of SP-ARPES measurements of surface
  Rashba states as well as Dirac cone states of topological insulators by 2D
  spin filter will be presented. Photoelectron spectroscopy is only useful t
 o conductive materials. In the case of insulating materials\, the charging 
 up effects spoils the ARPES\, though the details knowledge of their electro
 nic structures are as well demanded quite often. In such a case\, photon-in
  and photon-out experiment as RIXS is ideal\, although the micronano study 
 requires the focusing of the excitation synchrotron radiation. The advantag
 e of RIXS is the possibility to be measured under any external perturbation
 s. I will show an example of a study of half metal Heusler alloy under an e
 xternal magnetic field.    Abstract  
DTSTAMP:20240625T130200
DTSTART:20240628T101500
CLASS:PUBLIC
LOCATION:Lecure Hall A (1.3.14)\n Department of Physics\n Arnimallee 14\n 1
 4195 Berlin
SEQUENCE:0
SUMMARY:Special Seminar: Prof. Shigemasa Suga - Photoelectron Momentum Micr
 oscopy and Soft X-ray Resonant Inelastic Scattering with spatial resolution
  down to sub-μm scale and prospect of their operand measurements
UID:143661319@/www.physik.fu-berlin.de
URL:https://www.physik.fu-berlin.de/en/fachbereich/veranstaltungen/kalender
 /diverses/2024/special-seminar-shigemasa-suga.html
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